Surface profilometer DCM8 Leica Microsystems

Description

The Leica DCM8 surface profilometer combines two types of surface acquisition: interferometry and confocal microscopy. This allows the surface captures with inframicrometric (less than a millionth of meter) resolution in X and Y and at the nanometer (billionth of meter) scale in Z.

Use

The Leica DCM8 allows us to capture dental surfaces at micrometric scale to characterize dental abrasion. This is associated with a treatment and analytic plateform including different software such LeicaMap, Toothfrax, and Sfrax, allowing to quantify and compare the surface descriptive parameters. Applications on non-biological material such tool stone, plastic or metallic tools are possible as well.

Funding

Fundings from CNRS and French National Agency for Research (ANR-13-JSV7-0008).

Contact

2019-03-08T16:03:11+00:00

GESTIONNAIRES

ADRESSE POSTALE

Université de Poitiers – UFR SFA

PALEVOPRIM UMR CNRS 7262

Bât B35 – TSA 51106

6 rue Michel Brunet

86073 POITIERS Cedex 9

Tél. : 05 49 45 37 53